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Detailed entries for one subject from the INDEX TO HOW TO DO IT INFORMATION.
Click on a see also (sa) or tracing (xx) to view detailed entries about a related subject.
The entries are in alphabetical order by magazine name and then in chronological sequence.
To obtain a copy of any magazine article contact your local public library or the publisher.

RANDOM-ACCESS MEMORY TESTING
xx   RANDOM-ACCESS MEMORY

Memory pattern sensitivity test written for a 6800 based system.
BYTE Oct 1978 (v.3#10) pg. 12

Memory test program written in BASIC. Runs in MITS 8K BASIC and tests up to 16K of memory.
BYTE Oct 1978 (v.3#10) pg. 58

8080 search routine will locate all unprotected memory blocks from 0000 to FFFF and report the starting and ending address of each block.
BYTE Jun 1979 (v.4#6) pg. 207

8080 assembly language routine to test up to 64K of memory.
BYTE Aug 1979 (v.4#8) pg. 215

Relative subroutines for the Z80. A memory test program for the TRS-80 involved the writing of a relative subroutine which was not address-specific so that it could be moved from high to low memory and back again as the test proceeded. The technique can be used to simplify the creation of relocatable programs.
BYTE Dec 1979 (v.4#12) pg. 87

Memory test program for the Z80 microprocessor. May be modified for 8080 systems.
BYTE Sep 1981 (v.6#9) pg. 432

Test your memory using the barber-pole algorithm. Useful diagnostic information is not hard to obtain, as this example coded for the 8080 processor shows.
BYTE Dec 1982 (v.7#12) pg. 414

Memory debugging. Program to determine if all memory locations will hold data and if there is any cross feed to other locations. Written in assembler language for a Polymorphic Systems Poly 88 System 6.
KILOBAUD MICROCOMPUTING #16 Apr 1978 pg. 64

Cook's memory test. A comprehensive memory test for the 8080 based computer.
KILOBAUD MICROCOMPUTING #19 Jul 1978 pg. 70
Correction KILOBAUD MICROCOMPUTING #22 Oct 1978 pg. 100
Correction KILOBAUD MICROCOMPUTING #23 Nov 1978 pg. 128

Memory Map: a diagnostic program that will test the address space from address 0000 through FFFF (or higher). Bad chips in RAM memory can be located. Memory data is not destroyed during the test.
KILOBAUD MICROCOMPUTING #39 Mar 1980 pg. 160

Program for 8080/Z-80 systems will test memory and isolate both hard and soft errors.
KILOBAUD MICROCOMPUTING #40 Apr 1980 pg. 190

28 byte program tests 8080 RAM. Uses the PUSH and POP instructions.
KILOBAUD MICROCOMPUTING #41 May 1980 pg. 200

Cook's memory test for the 6502-based system.
KILOBAUD MICROCOMPUTING #42 Jun 1980 pg. 178

Memory checking program for an 1802-based computer will locate defective chips in an ELF II.
KILOBAUD MICROCOMPUTING #44 Aug 1980 pg. 162

Hippity-hop memory test written for the North Star computer, but may be adapted to other systems. Will test all bits and the interaction between bits as well as addressing problems. Locates pattern sensitive errors before failure.
KILOBAUD MICROCOMPUTING #53 May 1981 (v.5#5) pg. 166

Memory display program written in North Star BASIC will print the contents of any memory location in binary, hex, decimal and ASCII.
KILOBAUD MICROCOMPUTING #54 Jun 1981 (v.5#6) pg. 74

Cook's memory test adapted for the PET computer.
KILOBAUD MICROCOMPUTING Jan 1982 (v.6#1) pg. 146

Memory lister program to display the contents of a selected segment of IBM PC memory in 256 byte blocks per screen. Displayed in both HEXADECIMAL and ASCII format.
MICROCOMPUTING #75 Mar 1983 (v.7#3) pg. 16

Two short monitor programs for the Timex/Sinclair 1000 take the tedium out of examining memory locations.
MICROCOMPUTING #85 Jan 1984 (v.8#1) pg. 41

How to locate and run the RAM test program, music program, and a renumber program located within Apple's Integer BASIC.
MICROCOMPUTING Jul 1984 (v.8#7) pg. 102

Memory test program using random numbers. Written for a 4K block of memory on a 4K boundry. Written for an 8080 based machine.
POPULAR ELECTRONICS [1] Mar 1977 (v.11#3) pg. 107

How to test the number of "soft" errors introduced into computer memory RAM chips by alpha particles striking the chip.
POPULAR ELECTRONICS [1] Sep 1980 (v.18#3) pg. 105

Build a sophisticated dynamic RAM (DRAM) tester. Provides function, speed and margin tests. Est. cost: $60 (kit).
RADIO-ELECTRONICS May 1991 (v.62#5) pg. 33