Correction KILOBAUD MICROCOMPUTING #23 Nov 1978 pg. 128
Memory Map: a diagnostic program that will test the address space from address 0000 through FFFF (or higher). Bad chips in RAM memory can be located. Memory data is not destroyed during the test.
KILOBAUD MICROCOMPUTING #39 Mar 1980 pg. 160
Program for 8080/Z-80 systems will test memory and isolate both hard and soft errors.
KILOBAUD MICROCOMPUTING #40 Apr 1980 pg. 190
28 byte program tests 8080 RAM. Uses the PUSH and POP instructions.
KILOBAUD MICROCOMPUTING #41 May 1980 pg. 200
Cook's memory test for the 6502-based system.
KILOBAUD MICROCOMPUTING #42 Jun 1980 pg. 178
Memory checking program for an 1802-based computer will locate defective chips in an ELF II.
KILOBAUD MICROCOMPUTING #44 Aug 1980 pg. 162
Hippity-hop memory test written for the North Star computer, but may be adapted to other systems. Will test all bits and the interaction between bits as well as addressing problems. Locates pattern sensitive errors before failure.
KILOBAUD MICROCOMPUTING #53 May 1981 (v.5#5) pg. 166
Memory display program written in North Star BASIC will print the contents of any memory location in binary, hex, decimal and ASCII.
KILOBAUD MICROCOMPUTING #54 Jun 1981 (v.5#6) pg. 74
Cook's memory test adapted for the PET computer.
KILOBAUD MICROCOMPUTING Jan 1982 (v.6#1) pg. 146
Memory lister program to display the contents of a selected segment of IBM PC memory in 256 byte blocks per screen. Displayed in both HEXADECIMAL and ASCII format.
MICROCOMPUTING #75 Mar 1983 (v.7#3) pg. 16
Two short monitor programs for the Timex/Sinclair 1000 take the tedium out of examining memory locations.
MICROCOMPUTING #85 Jan 1984 (v.8#1) pg. 41
How to locate and run the RAM test program, music program, and a renumber program located within Apple's Integer BASIC.
MICROCOMPUTING Jul 1984 (v.8#7) pg. 102
Memory test program using random numbers. Written for a 4K block of memory on a 4K boundry. Written for an 8080 based machine.
POPULAR ELECTRONICS [1] Mar 1977 (v.11#3) pg. 107
How to test the number of "soft" errors introduced into computer memory RAM chips by alpha particles striking the chip.
POPULAR ELECTRONICS [1] Sep 1980 (v.18#3) pg. 105
Build a sophisticated dynamic RAM (DRAM) tester. Provides function, speed and margin tests. Est. cost: $60 (kit).
RADIO-ELECTRONICS May 1991 (v.62#5) pg. 33